Mettler-Toledo launches dual energy x-ray system globally

Mettler-Toledo Product Inspection has announced the global launch of the X56 DXD+ dual energy photon-counting x-ray system with AI capabilities, expanding the innovative X6 Series portfolio. The X56 DXD+ enables manufacturers to inspect every product with confidence by delivering enhanced contamination detection capabilities. This makes the x-ray solution useful for challenging applications where low-density contaminants, such as rubber and plastics must be reliably detected.

The X6 Series now offers manufacturers a full range of x-ray inspection solutions to suit different product sizes, from individual packs to large cases or multi-packs. The X56 DXD+ builds on the success of the X16 and X36.2 systems and brings advanced dual energy photon-counting capabilities for medium to large-sized products on single lanes or smaller packages running across multiple lanes, in a 500mm system width.

AI integration helps to improve the quality and reliability of quality inspection tasks while reducing unnecessary product rejection. This is beneficial to overcoming inspection challenges in complex scenarios like overlapping or mixed products and contributing to increasing production process efficiencies.

Discrimination Pro (AMD Pro) software, the X56 DXD+ delivers performance for complex applications that conventional single energy systems may struggle with, particularly when detecting low-density contaminants in packaged products with high variability in thickness, density or overlapping textures, such as multi-packs, bags of crisps or bulkier cartons. This high level of detection sensitivity supports effective quality control, even in noisy or high-contrast products where conventional systems may fall short.

This makes the X56 DXD+ a powerful complement to the X6 Series. The X16 is positioned for inspecting single packages at high speed and the X36.2 is customisable for more advanced, high-throughput environments and is available for multi-lane inspections.

The X56 DXD+ has been designed with operational efficiency in mind. The system combines premium detection performance with an intuitive interface, toolless belt removal for fast cleaning and a robust hygienic design suited to high-speed, high-volume environments. With throughput rates of up to 500 products per minute, the X56 DXD+ matches the demands of production lines, helping manufacturers boost efficiency and combat rising operational costs through enhanced productivity and intelligent design.

Through built-in product quality tools including completeness checks, clip detection and product trapped in seal inspection, the X56 DXD+ also supports effective quality control by enhancing consistency and protecting brand integrity beyond contamination detection alone.

Compatible with a wide range of conveyor heights and reject options, and available in single or multi-lane configurations, the X56 DXD+ has been developed as a global solution for manufacturers needing greater flexibility and performance. Its advanced software provides full traceability through a recorded image database, which can be accessed on-screen or integrated with Mettler-Toledo ProdX data management software for centralised monitoring and compliance.

This connectivity, along with support for common network protocols, makes compliance easier by enabling real-time monitoring, secure record-keeping and simplified audit readiness across global production environments. ProdX automates the monitoring, reporting and collation of all inspection activities in real-time. The securely stored data helps facilitate regulatory compliance, provides clear proof of due diligence to protect brand reputation and enables data-driven decisions that can lead to performance and productivity improvements across the line. To learn more, visit www.mt.com/xray-x56plus-pr